Digital Image Correlation: Vic-Software

The Vic-Soft­ware is well known and famous for digi­tal image cor­re­la­ti­on — espe­cial­ly through app­li­ca­ti­ons and publi­ca­ti­ons in solid mecha­nics and mate­ri­al rese­arch. It is used for all 2D, 3D and volu­metric DIC-Sys­tems of isi-sys GmbH. The Vic-Soft­ware is deve­lo­ped by our part­ner Cor­re­la­ted Solu­ti­ons Inc, (USA) based on the rese­arch of Pro­fes­sor Sut­ton, Uni­ver­si­ty of South Caro­li­ner. The theo­ry behind is detail­ed exp­lai­ned in the book “Image Cor­re­la­ti­on for Shape, Moti­on and Defor­ma­ti­on Mea­su­re­ments” by Micha­el A. Sut­ton, Jean-José Orteu and Hubert W. Schrei­er. It is used and vali­da­ted by a num­ber of well known labo­ra­to­ries such as NASA and Air­bus (see our refe­rence list).

 

Vic-2D-Software

Software VIC 2D-3Key fea­tures of the product:

  • Mea­su­re­ment of full-field, in-pla­ne displacements
  • Easy to use
  • Cor­re­la­ti­on ana­ly­sis with images from only one camera
  • 2 Soft­ware licen­ses: one on a desk­top or lap­top com­pu­ter, the second on a USB don­gle for any com­pu­ter you chooses
  • Ful­ly inte­gra­ted with Cut & Pas­te functionality

 

 

 

 

Vic-3D-Software

  • Software VIC3D-2Accu­ra­te full-field 2D and 3D mea­su­re­ment of shape, dis­pla­ce­ments, and strains of the test article
  • User friend­ly data inspec­tion tools
  • Fle­xi­ble data extrac­tion of sta­tis­tics, time-histo­ry from points or regi­ons, line-sli­ces, and much more
  • Pre­cise node data extrac­tion for FEA com­pa­ri­son / validation
  • Mea­su­re­ment of full-field, in-pla­ne displacements
  • 2 Soft­ware licen­ses: one on a desk­top or lap­top com­pu­ter, the second on a USB don­gle for any com­pu­ter you chooses
  • Cut & Pas­te functionality

 

 

 

Vic-Volume Software

Software VIC Volume

Soft­ware features:

  • Mea­su­re inter­nal volu­metric defor­ma­ti­on uti­li­zing images from X‑Rays or CT Scanners
  • Obtain 3‑dimensional volu­metric dis­pla­ce­ment and strain data
  • View, extract and ani­ma­te full-field con­tour plots of mul­ti-direc­tio­n­al strain variables
  • High reso­lu­ti­on and accuracy